SEMINAR
Shanghai Institute of Ceramics, Chinese Academy of Sciences
中 国 科 学 院 上 海 硅 酸 盐 研 究 所

Probing Nanomaterials – the Interplay of Synchrotron Radiation Spectroscopy, Morphology and Electronic Structures

Professor T. K. Sham

Department of Chemistry, University of Western Ontario, Canada

时间：2011年10月24日 (星期一) ，上午9:30

地点：2号楼607

联系人：朱英杰研究员

Abstract:

The advent of maturing synchrotron techniques and nanotechnology has provided an exciting playground and unprecedented opportunities for materials research. The very bright, energy tuneable, highly collimated and pulsed synchrotron light sources of the third generation worldwide are making synchrotron light more readily available for a wide spectrum of materials research.1 In this talk, a brief introduction will be given on synchrotron radiation, followed by selected applications. Emphasis will be placed on the application of soft X-ray spectroscopy for materials analysis. Techniques include: X-ray Absorption Fine Structures (XAFS), X-ray emission (XES), X-ray excited optical luminescence (XEOL) in both energy and time domain and Scanning Transmission X-ray Microscopy (STXM). Synchrotron studies of Si and C based nanostructures, ZnO nanostructure and composites, TiO₂ nanotubes and calcium silicate porous materials among others will be described to illustrate the unique solutions provided by synchrotron technology. The prospects of these techniques and their applications will also be noted.